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Updated: May 26, 2026

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On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
Published on: March 11, 2022
Growth kinetics in a strained crystal film on a wavy patterned substrate
1Institut Matériaux Microélectronique Nanoscience de Provence, Aix-Marseille Université, UMR CNRS 6242, Marseille, France.
Summary
We investigated how patterned substrates influence strained film growth. The film surface can shift between ordered and disordered states based on substrate patterns and annealing time.
Area of Science:
- Materials Science
- Surface Physics
- Continuum Mechanics
Background:
- Thin films can exhibit morphological instabilities, such as the Asaro-Tiller-Grinfeld instability.
- Patterned substrates can influence thin film morphology through surface interactions.
- Understanding these interactions is crucial for designing advanced materials and devices.
Purpose of the Study:
- To investigate the combined effects of Asaro-Tiller-Grinfeld instability and patterned substrates on strained thin film morphology.
- To develop a continuum model that incorporates elasticity, surface energy, and wetting interactions.
- To analyze the kinetic phase diagram governing film surface evolution.
Main Methods:
- Continuum surface diffusion model.
- Inclusion of elasticity, surface energy, and wetting interactions.
- Linear stability analysis of mechanical equilibrium and growth dynamics during annealing.
Main Results:
- The kinetic phase diagram was characterized as a function of time, film thickness, and wavelength ratios.
- The film surface can transition from an in-phase configuration to out-of-phase or non-ordered states.
- These transitions depend on the substrate pattern wavelength and annealing duration.
Conclusions:
- Substrate patterns can effectively control strained film morphology.
- The interplay between intrinsic film instability and substrate organization dictates the final film structure.
- This study provides insights into the rational design of patterned thin films with desired properties.
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