Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Iodine Close Packing in Hybrid Halide Bismuth(III) and Antimony(III) Semiconductors: (NH<sub>3</sub>(CH<sub>2</sub>)<sub>7</sub>NH<sub>3</sub>)<sub>2</sub>Bi<sub>2</sub>I<sub>10</sub> and (NH<sub>3</sub>(CH<sub>2</sub>)<sub>7</sub>NH<sub>3</sub>)<sub>2</sub>Sb<sub>2</sub>I<sub>10</sub>.

Inorganic chemistry·2026
Same author

Conductivity Spectroscopy for Investigation and Discovery of Photovoltaic Materials.

Chemical reviews·2026
Same author

Shifting Defect Self-Regulation via Disordered Vacancies in Hollow Tin Perovskites.

Chemistry of materials : a publication of the American Chemical Society·2026
Same author

Trion Formation Hampers Single Quantum Dot Performance in Silane-Coated FAPbBr<sub>3</sub> Quantum Dots.

Nano letters·2026
Same author

Photoinduced electron-transfer distance is controlled by the driving force in solid-state organic donor-acceptor systems.

Nature chemistry·2026
Same author

pH Regulates Ion Dynamics in Carboxylated Mixed Conductors.

Chemistry of materials : a publication of the American Chemical Society·2026
Same journal

Higher-Order Clustering of Receptors Real-Time Projected by Plasmon-ruler on the Single Live Cell.

Nano letters·2026
Same journal

Achieving Fermi-Level Depinning and Ideal Metal Contact in <i>β</i>-Ga<sub>2</sub>O<sub>3</sub> Devices via MXene Integration.

Nano letters·2026
Same journal

AI-Assisted Electron Microscopy in Structure-Performance Analysis of Advanced Catalysts: From Atomic Resolution to Statistical Significance.

Nano letters·2026
Same journal

Electrically Switchable Ultraslow Dispersionless Polaritons via Twist Engineering in van der Waals Heterostructures.

Nano letters·2026
Same journal

Correction to "Ultrasonication-Triggered Ubiquitous Assembly of Magnetic Janus Amphiphilic Nanoparticles in Cancer Theranostic Applications".

Nano letters·2026
Same journal

Tunable Proximity Valley Splitting Via Interfacial Exchange Pinning in WSe<sub>2</sub>-CrBr<sub>3</sub>-CrPS<sub>4</sub> Heterostructures.

Nano letters·2026
See all related articles

Related Experiment Video

Updated: May 25, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Submicrosecond time resolution atomic force microscopy for probing nanoscale dynamics.

Rajiv Giridharagopal1, Glennis E Rayermann, Guozheng Shao

  • 1Department of Chemistry, University of Washington, Seattle, Washington 98195, USA.

Nano Letters
|January 18, 2012
PubMed
Summary
This summary is machine-generated.

We developed a new atomic force microscopy (AFM) method for rapid, noncontact analysis of transient events. This technique links nanoscale dynamics to device performance without specialized equipment.

More Related Videos

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging
09:52

Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging

Published on: January 31, 2019

Related Experiment Videos

Last Updated: May 25, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging
09:52

Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging

Published on: January 31, 2019

Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Atomic Force Microscopy (AFM) is crucial for nanoscale analysis.
  • Current AFM methods face limitations in temporal resolution and require specialized hardware.
  • Understanding transient events is key for optimizing material and device performance.

Purpose of the Study:

  • To introduce a novel, cost-effective mechanical detection method for AFM.
  • To achieve high temporal resolution (~100 ns) for noncontact transient event detection.
  • To correlate nanoscale dynamics with the performance of organic photovoltaic devices.

Main Methods:

  • Development and validation of a new mechanical detection principle for AFM cantilever motion.
  • Simulation of the proposed method.
  • Experimental application to screen poly(3-hexylthiophene):phenyl-C(61)-butyric acid methyl ester photovoltaic devices.

Main Results:

  • The method enables noncontact discrimination of transient events with ~100 ns temporal resolution.
  • No custom AFM probes or expensive add-on hardware are required.
  • A correlation was found between device efficiency variations and nanoscale transient charging behavior.

Conclusions:

  • The new AFM method offers high temporal resolution for analyzing dynamic phenomena.
  • It successfully links local nanoscale dynamics to macroscopic device behavior.
  • The technique has broad applicability in scanning probe microscopy for diverse physical phenomena.