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Silica-rubber microstructure visualised in three dimensions by focused ion beam-scanning electron microscopy

L B Tunnicliffe1, A G Thomas, J J C Busfield

  • 1Department of Materials, Queen Mary University of London, London, UK.

Journal of Microscopy
|January 21, 2012
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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