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Published on: December 7, 2015
Variability in carbon nanotube transistors: improving device-to-device consistency
Aaron D Franklin1, George S Tulevski, Shu-Jen Han
1IBM T. J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, New York 10598, United States. aaronf@us.ibm.com
ACS Nano
|January 26, 2012
Summary
Researchers reduced variability in carbon nanotube transistors using a hydrophobic monolayer. This passivation technique significantly improves device consistency for digital applications.
Area of Science:
- Materials Science
- Nanotechnology
- Semiconductor Physics
Background:
- Carbon nanotube transistors exhibit significant hysteresis and threshold voltage variation, limiting their use in integrated circuits.
- Variability in carbon nanotube transistors is a major obstacle for their widespread adoption in digital electronics.
Purpose of the Study:
- To elucidate the origin of variability in carbon nanotube transistors.
- To develop a passivation strategy to improve device consistency.
Main Methods:
- Employed a top-coated, hydrophobic monolayer to passivate bottom-gated carbon nanotube field-effect transistors.
- Investigated the effect of passivating the nanotube channel versus only the supporting substrate.
- Analyzed the influence of gate and drain-source bias on hysteresis.
Main Results:
- Passivating the nanotube channel with a hydrophobic monolayer significantly reduced device-to-device variation.
- Hysteresis and threshold voltage variation were reduced by an average of 84% and 53%, respectively.
- Hysteresis showed a strong dependence on applied gate and drain-source bias.
Conclusions:
- A top-coated hydrophobic monolayer effectively mitigates variability in carbon nanotube transistors.
- Passivating the nanotube channel is crucial for improving device consistency.
- Understanding bias-dependent hysteresis is essential for evaluating passivation effectiveness.
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