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Published on: November 9, 2015
Photosensitivity and stress changes of Ge-free Bi-Al doped silica optical fibers under ArF excimer laser irradiation
Christian Ban1, Hans G Limberger, Valery Mashinsky
1Ecole Polytechnique Fédérale de Lausanne (EPFL), School of Engineering (STI), Lausanne, Switzerland.
Abstract:
The photosensitivity of germanium free Bi-Al-doped silica fibers with different bismuth concentrations was investigated using ArF excimer laser radiation at 193 nm and fiber grating formation. For the fiber with the highest bismuth concentration maximum refractive index changes of 2.2 × 10(-3) and 2.0 × 10(-4) were obtained for hydrogen loaded and unloaded fibers, respectively. Irradiation induced tensile stress changes were observed in the fiber core of H(2)-loaded and unloaded fibers. The results indicate a contribution of compaction to the total refractive index change in both cases.

