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Atomic Emission Spectroscopy: Instrumentation

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Atomic Emission Spectroscopy: Lab

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

Atomic Emission Spectroscopy: Overview

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Atomic Absorption Spectroscopy: Instrumentation

Atomic Absorption Spectroscopy: Instrumentation

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Related Experiment Video

Updated: May 25, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

One-shot spectrometer for several elements using an integrated conical crystal analyzer.

Kohei Morishita¹, Kouichi Hayashi, Kazuo Nakajima

¹Department of Socio-Environmental Energy Science, Kyoto University, Yoshida-Honmachi, Sakyo-ku, Kyoto, Japan.

The Review of Scientific Instruments

|February 4, 2012

Summary

This summary is machine-generated.

Researchers developed a novel conical germanium crystal analyzer for time-resolved x-ray spectrometry. This one-shot spectrometer offers high efficiency and energy resolution for ultrastrong x-ray sources like free electron lasers.

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Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

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Last Updated: May 25, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

Area of Science:

X-ray Physics
Spectrometry
Materials Science

Background:

Time-resolved x-ray spectrometry is a growing field, crucial for studying dynamic processes with ultrastrong x-ray sources.
Existing methods require advanced spectrometers capable of wide wavelength range, high efficiency, and good energy resolution for one-shot measurements.

Purpose of the Study:

To develop an integrated conical crystal analyzer for advanced time-resolved x-ray spectrometry.
To achieve a one-shot spectrometer with enhanced performance characteristics.

Main Methods:

Fabrication of an integrated conical germanium (Ge) crystal analyzer using a hot deformation technique.
The analyzer comprises multiple conical rings connected by spline surfaces for precise shaping of Ge wafers.
Utilized the analyzer with an alloy sample and a charge-coupled device (CCD) detector.

Main Results:

Simultaneous focusing of multiple characteristic x-ray lines from an alloy sample onto a CCD.
Achieved significantly high image brightness (100x gain compared to planar analyzers) and good spatial resolution (9-13 eV).
Enabled a short sample-detector distance (214.4 mm) due to the crystal's small radius of curvature (28-50 mm).

Conclusions:

Demonstrated the feasibility of a new focusing x-ray crystal spectrograph with controllable focal positions.
The developed conical Ge crystal analyzer is a promising tool for time-resolved x-ray spectrometry applications.