Related Experiment Video
Updated: May 25, 2026

09:45
Large-area Scanning Probe Nanolithography Facilitated by Automated Alignment and Its Application to Substrate Fabrication for Cell Culture Studies
Published on: June 12, 2018
Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile
1Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany. whoand@phys.sinica.edu.tw
The Review of Scientific Instruments
|February 4, 2012
Summary
This study introduces an anti-drift and auto-alignment mechanism for astigmatic detection system (ADS)-based atomic force microscopy (AFM). The novel system significantly reduces signal drift, enabling precise measurements.
Area of Science:
- Atomic Force Microscopy
- Optical Detection Systems
- Nanotechnology
Background:
- Conventional atomic force microscopes (AFMs) using astigmatic detection systems (ADS) face challenges with signal drift, leading to measurement inaccuracies.
- Commercial digital versatile disc (DVD) optical heads offer a low-cost, compact solution for ADS-AFM but are prone to significant signal drift (thousands of nanometers).
Purpose of the Study:
- To develop and implement an anti-drift and auto-alignment mechanism for an ADS-based AFM.
- To compensate for signal drift and achieve automatic cantilever alignment in a cost-effective AFM system.
Main Methods:
- Integration of a commercial DVD optical head with an astigmatic focus error signal for the AFM's optical path.
- Application of an anti-drift and auto-alignment mechanism utilizing a voice coil motor within the DVD optical head.
- Utilizing a sub-micron laser spot (~570 nm, FWHM) and a high-working bandwidth (80 MHz) for high-frequency probe measurements.
Main Results:
- Achieved near-zero signal drift, effectively compensating for previous issues of thousands of nanometers.
- Demonstrated automatic cantilever alignment capabilities.
- The developed mechanism simplified the overall AFM design.
Conclusions:
- The anti-drift and auto-alignment mechanism significantly enhances the stability and usability of ADS-based AFM systems.
- This approach provides a low-priced, compact, and user-friendly solution for high-precision nanoscale measurements.
- The system is capable of measuring sub-atomic displacements with high accuracy and reliability.

