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Published on: October 24, 2019
Circular multilayer zone plate for high-energy x-ray nano-imaging
Takahisa Koyama1, Hidekazu Takano, Shigeki Konishi
1Graduate School of Material Science, University of Hyogo, Ako, Hyogo, Japan.
A novel multilayer zone plate (MZP) was created for x-ray focusing. This advanced optics achieved 35 nm resolution, demonstrating potential for high-resolution imaging applications.
Area of Science:
- Optics and Photonics
- Materials Science
- X-ray Microscopy
Background:
- Multilayer zone plates (MZPs) are advanced diffractive optical elements for focusing radiation.
- Achieving high resolution with MZPs requires precise control over layer interfaces and material properties.
Purpose of the Study:
- To fabricate and evaluate the focusing performance of a circular multilayer zone plate (MZP) for 20-keV x-rays.
- To assess the potential of the MZP for achieving diffraction-limited resolution.
Main Methods:
- Fabrication of a circular MZP using alternating MoSi(2) and Si layers deposited by DC magnetron sputtering on a wire core.
- Evaluation of focusing performance using 20-keV x-rays.
- Conversion of measured line spread function to point spread function via tomographic reconstruction.
Main Results:
- The fabricated MZP interfaces satisfied the Fresnel zone condition.
- The MZP demonstrated the potential for diffraction-limited resolving power, calculated at 35 nm.
- Scanning transmission microscopy utilizing the MZP successfully resolved a 50-nm line-and-space pattern.
Conclusions:
- The developed circular MZP shows significant promise for high-resolution x-ray imaging.
- The fabrication method and material choices are suitable for achieving sub-50 nm resolution with MZPs.
- Further development could lead to MZPs enabling diffraction-limited resolution in x-ray microscopy.
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