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Algorithmic error correction of impedance measuring sensors

Oleg Starostenko1, Vicente Alarcon-Aquino, Wilmar Hernandez

  • 1Research Center CENTIA, Department of Computing, Electronics and Mechatronics, Universidad de las Américas, Puebla, 72820, México;

Sensors (Basel, Switzerland)
|February 4, 2012
PubMed

Keywords:
C-VG-V characteristic metererror correctionimpedance measuring sensor

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