Updated: May 25, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Monan Liu1, Xianglin Li, Siva Krishna Karuturi
1Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371, Singapore.
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Atomic layer deposition (ALD) enables precise nanofabrication for advanced applications. This technique is crucial for developing new materials in photonics, SERS, and energy storage, enhancing device performance and lifespan.
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