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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
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Non-contact AFM

Franz J Giessibl1, Seizo Morita

  • 1Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|February 8, 2012
PubMed
Summary

No abstract available in PubMed .

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