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Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

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Atomic Fluorescence Spectroscopy

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

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Published on: August 25, 2016

X-ray fluorescence holography.

Kouichi Hayashi1, Naohisa Happo, Shinya Hosokawa

  • 1Institute of Materials Research, Tohoku University, Sendai 980-8577, Japan.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|February 10, 2012
PubMed
Summary
This summary is machine-generated.

X-ray fluorescence holography (XFH) offers 3D atomic imaging for medium-range structural analysis. This technique reconstructs atomic images, overcoming limitations of other methods for analyzing local distortions and nanoclusters.

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Area of Science:

  • Materials Science
  • Crystallography
  • Atomic Physics

Background:

  • X-ray fluorescence holography (XFH) is an atomic resolution technique.
  • It uses fluorescing atoms as wave sources or interference field monitors within crystal samples.
  • XFH provides 3D atomic images around specific elements within a few nanometers.

Purpose of the Study:

  • To explain the theory and methodology of XFH.
  • To present solutions for the twin-image problem in XFH.
  • To introduce advanced measuring systems and data processing for atomic image reconstruction.

Main Methods:

  • Utilizing fluorescing atoms as wave sources in holographic interferometry.
  • Developing advanced XFH systems for data acquisition.
  • Implementing data processing algorithms to reconstruct 3D atomic images and solve the twin-image problem.

Main Results:

  • Demonstrated the capability of XFH for medium-range local structural analysis.
  • Successfully reconstructed 3D atomic images around specified elements.
  • Applied XFH to analyze local lattice distortions in mixed crystals and nanoclusters in shape-memory alloys.

Conclusions:

  • XFH is a powerful tool for medium-range local structural analysis, complementing X-ray diffraction and X-ray absorption fine structure.
  • The developed methods enable detailed 3D atomic imaging.
  • XFH has significant potential for analyzing complex material systems like mixed crystals and nanoclusters.