Spatially resolved frequency-dependent elasticity measured with pulsed force microscopy and nanoindentation

Kim K M Sweers1, Kees O van der Werf, Martin L Bennink

  • 1Nanobiophysics, MESA+ Institute for Nanotechnology, Faculty of Science and Technology, University of Twente, Enschede, The Netherlands.

Nanoscale
|February 15, 2012
PubMed
Summary

Atomic Force Microscopy (AFM) techniques reveal frequency-dependent mechanical properties in complex materials. Understanding this behavior is crucial for accurate nanomechanical measurements and material calibration.

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