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Updated: May 24, 2026

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
Published on: April 24, 2018
Assessment of deviatoric lattice strain uncertainty for polychromatic X-ray microdiffraction experiments
Andrew Poshadel1, Paul Dawson, George Johnson
1Sibley School of Mechanical and Aerospace Engineering, 196 Rhodes Hall, Cornell University, Ithaca, NY 14853, USA. acp42@cornell.edu
Abstract:
X-ray microdiffraction is a powerful technique for conducting high-spatial-resolution lattice strain measurements. However, there has been limited validation of the technique to date. An experiment was conducted at the Advanced Light Source to assess the uncertainty of deviatoric lattice strains measured using polychromatic X-ray microdiffraction. It is shown that the measurement uncertainty is different for each component of the deviatoric lattice strain tensor. Monte Carlo simulations of the experiment are used to explain the differences in uncertainty. The simulations point to the existence of spurious deformation modes that arise erroneously in the strain calculation owing to measurement noise and limited pole figure coverage. Methods for reducing measurement uncertainty are proposed.
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