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Updated: May 24, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Qing Tan1, Matthieu Roussey, Armando Cosentino
1Ecole Polytechnique Fédérale de Lausanne, Institute of Microengineering, Optics & Photonics Technology Laboratory, Neuchâtel, Switzerland. qing.tan@epfl.ch
We developed a novel annular aperture array (AAA) device for highly sensitive on-chip sensing. This reflective cavity shows near-perfect absorption and a sensitivity of 764 nm/RIU for refractive index sensing.
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