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Updated: May 24, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
A Ortega-Esteban1, I Horcas, M Hernando-Pérez
1Departamento de Física de la Materia Condensada, C-3, Universidad Autónoma de Madrid, Cantoblanco, 28049 Madrid, Spain.
This study introduces an improved atomic force microscopy jumping mode to accurately detect tip-sample contact, minimizing forces for better imaging of delicate biological samples like viruses.
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