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Updated: May 24, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Agile linear interferometric method for carrier-envelope phase drift measurement
P Jójárt1, Á Börzsönyi, B Borchers
1Department of Optics and Quantum Electronics, University of Szeged, P.O. Box 406, H-6701 Szeged, Hungary.
Abstract:
A bandwidth-independent and linear interferometric method for the measurement of the carrier-envelope phase drift of ultrashort pulse trains is demonstrated. The pulses are temporally overlapped in a resonant multiple-beam interferometer. From the position of the spectral interference pattern, the relative carrier-envelope phase between two subsequent oscillator pulses is obtained at data acquisition rates up to 200 Hz. Cross calibration has been performed by f-to-2f interferometry in two independent experiments. The optical length of the interferometer has been actively stabilized, leading to a phase jitter of 117 mrad (rms). These results indicate a reduced noise and quicker data acquisition in comparison with previous linear methods for measuring the carrier-envelope phase drift.
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