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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Development and application of multiple-probe scanning probe microscopes.

Tomonobu Nakayama1, Osamu Kubo, Yoshitaka Shingaya

  • 1International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Ibaraki, Japan.

Advanced Materials (Deerfield Beach, Fla.)
|March 2, 2012
PubMed
Summary
This summary is machine-generated.

Multiple-probe scanning probe microscopes (MP-SPMs) enable precise nanoscale electrical conductivity measurements. These advanced tools, including double, triple, and quadruple-probe systems, are crucial for characterizing novel nanomaterials.

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Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions
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Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions
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Applications of the Single-probe: Mass Spectrometry Imaging and Single Cell Analysis under Ambient Conditions

Published on: June 14, 2016

Area of Science:

  • Nanoscience and Nanotechnology
  • Materials Science
  • Electrical Engineering

Background:

  • Measuring nanoscale electrical conductivity is vital for advanced materials research.
  • Multiple-probe scanning probe microscopes (MP-SPMs) offer a solution for localized conductivity measurements.
  • Existing techniques require precise electrical contact at the nanoscale.

Purpose of the Study:

  • To review the development and applications of multiple-probe scanning probe microscopes (MP-SPMs).
  • To highlight the capabilities of MP-SPMs in measuring electrical conductivity of various nanostructures.
  • To present advancements in MP-SPM technology for nanoscale characterization.

Main Methods:

  • Development of double, triple, and quadruple-probe scanning tunneling microscopes (STM) and atomic force microscopes (AFM).
  • Independent operation of multiple probes for simultaneous imaging and electrical contact.
  • Application of MP-SPMs to measure conductivity in nanowires, carbon nanotubes, and molecular films.

Main Results:

  • Demonstrated the ability of MP-SPMs to measure nanoscale local electrical conductivity.
  • Successfully characterized one-dimensional and two-dimensional nanostructures.
  • Developed quadruple-probe systems (QP-STM, QP-AFM) to mitigate contact resistance issues.
  • Created software for simultaneous control of four probes.

Conclusions:

  • MP-SPMs are powerful tools for nanoscale electrical characterization.
  • Advancements in MP-SPM technology enable accurate conductivity measurements on diverse nanostructures.
  • These techniques are essential for the progress of nanoscience and nanotechnology research.