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Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...

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Biomolecular Imaging of Cellular Uptake of Nanoparticles using Multimodal Nonlinear Optical Microscopy
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A new TriBeam system for three-dimensional multimodal materials analysis.

McLean P Echlin1, Alessandro Mottura, Christopher J Torbet

  • 1Materials Department, University of California at Santa Barbara, Santa Barbara, California 93101, USA. mechlin@engineering.ucsb.edu

The Review of Scientific Instruments
|March 3, 2012
PubMed
Summary
This summary is machine-generated.

A new TriBeam system combines femtosecond lasers and focused ion beams for rapid 3D materials analysis. This system enables faster, high-resolution imaging and elemental analysis with minimal thermal damage.

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Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions
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Biomolecular Imaging of Cellular Uptake of Nanoparticles using Multimodal Nonlinear Optical Microscopy
07:13

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Published on: May 16, 2022

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions
13:43

Correlative Microscopy for 3D Structural Analysis of Dynamic Interactions

Published on: June 24, 2013

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Focused Ion Beam (FIB) microscopy is a powerful tool for 3D materials analysis.
  • Traditional FIB techniques can be slow and may cause thermal damage.
  • There is a need for faster, high-resolution 3D analysis methods.

Purpose of the Study:

  • To develop a novel system for rapid 3D materials analysis by integrating femtosecond lasers with FIB.
  • To demonstrate the capability of in situ layer-by-layer material ablation with high removal rates.
  • To enable high-resolution imaging and analysis without sample removal or extensive preparation.

Main Methods:

  • Integration of ultrashort pulse femtosecond lasers with a focused ion beam (FIB) platform.
  • Utilizing high pulse frequency (1 kHz) and ultrashort (150 fs) laser pulses for material ablation.
  • Employing a DualBeam™ microscope for high resolution and broad detector capabilities.

Main Results:

  • Achieved rapid in situ layer-by-layer material ablation with high material removal rates.
  • Demonstrated virtually no thermal damage to the surrounding area during ablation.
  • Enabled 3D datasets to be acquired at rates 4-6 orders of magnitude faster than traditional 3D FIB datasets.
  • Presented initial in situ multilayer data.

Conclusions:

  • The developed TriBeam system significantly accelerates 3D materials analysis.
  • The integration of femtosecond lasers with FIB offers a powerful solution for high-throughput, high-resolution materials characterization.
  • This approach minimizes thermal damage and eliminates the need for intermediate sample preparation.