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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 24, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Constant tip-surface distance with atomic force microscopy via quality factor feedback.

Lin Fan¹, Daniel Potter, Todd Sulchek

¹George W. Woodruff School of Mechanical Engineering, Parker H. Petit Institute for Bioengineering and Bioscience, Georgia Institute of Technology, Atlanta, Georgia 30332, USA.

The Review of Scientific Instruments

|March 3, 2012

Summary

This summary is machine-generated.

This study introduces a closed-loop atomic force microscope (AFM) control system that monitors cantilever quality factor (Q) to compensate for thermal and mechanical drifts, enabling stable nanoscale measurements.

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Area of Science:

Nanotechnology
Surface Science
Microscopy

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging and force measurements.
Thermal and mechanical drifts in AFM systems limit measurement accuracy.
Precise tip-surface distance control is essential for reliable AFM operation.

Purpose of the Study:

To develop a drift compensation method for AFM by actively controlling tip-surface distance.
To enhance the stability and reliability of AFM measurements, particularly for sensitive interactions.
To enable long-term nanoscale studies using AFM.

Main Methods:

Implementing a closed-loop control system that monitors the cantilever quality factor (Q).
Utilizing Brownian thermal fluctuations to fit the thermal noise spectrum to a Lorentzian function for Q determination.
Controlling tip-surface distance based on changes in cantilever damping.

Main Results:

The AFM tip position was maintained within 40 nm of a setpoint in air and 3 nm in water with 95% reliability.
Cantilever damping was shown to be sufficiently sensitive to tip-surface distance for effective control.
The method allows for stable hovering of the AFM tip above a sample surface.

Conclusions:

The developed closed-loop Q-monitoring system effectively compensates for AFM drift.
This technique significantly improves the precision and reliability of nanoscale measurements.
The method opens possibilities for studying delicate nanoscale interactions over extended durations.