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Updated: May 24, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Application of length vernier in phase coincidence detection and precision frequency measurement
Miao Miao1, Zhou Wei, Wang Bin
1Department of Measurement and Instrument, Xidian University, Xi'an 710071, People's Republic of China. mmiao@mail.xidian.edu.cn
Abstract:
For comparison of arbitrary frequency signals, the paper proposed two levels of length vernier based on the time-space relationship are used in three levels of phase coincidence detecting circuits to extract the phase coincidence information by proper logic calculation. The length∕phase of each vernier is respectively corresponding to the accuracy and the resolution of detecting circuit. The time-space relationship is based on high-stability, high-accuracy, and high-speed of signal transmission. The method is effective to reduce the fuzzy region in the phase coincidence information and reach a higher measuring precision.
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