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Reliability test of an electron cyclotron resonance ion source for accelerator driven sub-critical system
1China Institute of Atomic Energy, P. O. Box 275(27), Beijing 102413, China. cui@ciae.ac.cn
Abstract:
The reliability test of an electron cyclotron resonance ion source developed for accelerator driven sub-critical system is carried out in China Institute of Atomic Energy. A unique technique to improve the reliability is adopted. The source is operated for more than 200 h at 75 keV, 100 mA extracted hydrogen current, while 2 beam trips are recorded in the period, and uninterrupted operation time is about 150 h. The experimental result is described.
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