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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
Electron Behavior00:54

Electron Behavior

Overview
Electrons are negatively charged subatomic particles that are attracted to an orbit around the positively-charged nucleus of an atom. They reside in locations that are associated with energy levels called shells and are further organized into sub-shells and orbitals within each shell.
Electrons Orbit the Nucleus
Electrons are found in specific locations outside of the nucleus. The shell in which an electron resides indicates the general energy level of the electron: those closer to the...
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview01:19

Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview

In inductively coupled plasma–mass spectrometry (ICP–MS), an inductively coupled plasma (ICP) torch is used as an atomizer and ionizer. Solid samples are dissolved and volatilized before being introduced into the high-temperature argon plasma, while solution samples are nebulized and passed through the high-temperature argon plasma. Plasma dissociates the analytes and ionizes their component atoms to form a mixture of positive ions and molecular species. The positive ions are then passed on to...
Electron Orbital Model01:18

Electron Orbital Model

Orbitals are the areas outside of the atomic nucleus where electrons are most likely to reside. They are characterized by different energy levels, shapes, and three-dimensional orientations. The location of electrons is described most generally by a shell or principal energy level, then by a subshell within each shell, and finally, by individual orbitals found within the subshells.
The first shell is closest to the nucleus, and it has only one subshell with a single spherical orbital called the...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Chemical Ionization (CI) Mass Spectrometry01:21

Chemical Ionization (CI) Mass Spectrometry

The molecular ion peak of a molecule in the mass spectrum provides vital information for molecular identification. However, conventional electron impact ionization can lead to the rapid dissociation of some molecular ions before they reach the detector. A milder ionization method is required to increase the lifetime of such ionized analyte molecules. Chemical ionization (CI) is a gas-phase protonation reaction useful for mass-analyzing analyte molecules that are easily protonated to yield the...

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Related Experiment Video

Updated: May 24, 2026

Fully Autonomous Characterization and Data Collection from Crystals of Biological Macromolecules
07:11

Fully Autonomous Characterization and Data Collection from Crystals of Biological Macromolecules

Published on: March 22, 2019

A particle-in-cell Monte Carlo code for electron beam ion source simulation.

L Zhao1, B Cluggish, J S Kim

  • 1FAR-TECH, Inc., San Diego, California 92121, USA.

The Review of Scientific Instruments
|March 3, 2012
PubMed
Summary

FAR-TECH, Inc. developed EBIS-PIC, a particle-in-cell Monte Carlo code, to simulate ion dynamics in electron beam ion sources (EBIS). Preliminary results show good agreement with fast trapping experiments.

Related Experiment Videos

Last Updated: May 24, 2026

Fully Autonomous Characterization and Data Collection from Crystals of Biological Macromolecules
07:11

Fully Autonomous Characterization and Data Collection from Crystals of Biological Macromolecules

Published on: March 22, 2019

Area of Science:

  • Plasma Physics
  • Computational Physics
  • Accelerator Science

Background:

  • Electron Beam Ion Sources (EBIS) are crucial for producing highly charged ions.
  • Accurate modeling of ion dynamics within EBIS is essential for optimizing performance.
  • Existing models may not fully capture complex collision processes and space charge effects.

Purpose of the Study:

  • To develop and validate a novel particle-in-cell Monte Carlo code (EBIS-PIC) for simulating ion behavior in EBIS.
  • To investigate the influence of atomic and Coulomb collisions on ion trapping.
  • To compare simulation results with experimental data from the BNL electron beam test stand (EBTS).

Main Methods:

  • Simulated a steady-state electron beam using the PBGUNS code.
  • Employed the Monte Carlo method to track injected primary ions and background gas ions.
  • Incorporated atomic and Coulomb collisions into the particle tracking.
  • Updated space charge potential by solving the Poisson equation iteratively.

Main Results:

  • Preliminary simulation results from EBIS-PIC were generated.
  • The code successfully models ion tracking, including collision effects and space charge potentials.
  • Simulation outcomes show promising agreement with BNL EBTS fast trapping experiments.

Conclusions:

  • The EBIS-PIC code provides a viable tool for modeling ion dynamics in EBIS.
  • The inclusion of atomic and Coulomb collisions is important for accurate simulations.
  • The code's predictive capability is supported by preliminary experimental validation.