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Updated: May 24, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Off-line ionization tests using the surface and the plasma ion sources of the SPES project
M Manzolaro1, M Manente, D Curreli
1INFN-Legnaro National Laboratories, Legnaro, Padova, Italy. mattia.manzolaro@lnl.infn.it
Abstract:
The development of new target ion source systems for the selective production of exotic species (SPES) facility is currently in progress at Legnaro National Laboratories. In this context, the study of ion sources and their performance in terms of ionization efficiency and transversal emittance is a crucial point in order to maximize the available yields, particularly for short-lived isotopes. In this work, preliminary off-line ionization efficiency and emittance measurements for the SPES surface and plasma ion sources are presented. The plasma source emittance measurements are supported by dedicated numerical calculations.
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