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Updated: May 24, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Resolution determination in X-ray microscopy: an analysis of the effects of partial coherence and illumination

J M Heck1, D T Attwood, W Meyer-Ilse

  • 1Center for X-Ray Optics, E.O. Lawrence Berkeley National Laboratory, Berkeley, CA, USA.

Journal of X-Ray Science and Technology
|March 6, 2012
PubMed

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