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Updated: May 24, 2026
10:18
Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography
Published on: February 21, 2017
Pore-scale evaporation-condensation dynamics resolved by synchrotron x-ray tomography
1Soil and Terrestrial Environmental Physics Laboratory, Swiss Federal Institute of Technology (ETHZ), Universitätstrasse 16, CH-8092 Zürich, Switzerland.
Summary
This study visualizes liquid-vapor interfaces in porous media using synchrotron imaging. The findings confirm an analytical model for capillary condensation, crucial for understanding friction in various applications.
Area of Science:
- Porous media physics
- Interfacial phenomena
- Multiphase flow
Background:
- Capillary processes significantly impact vapor transport and liquid content in porous materials.
- Understanding pore-scale interfacial dynamics is key to predicting macroscopic behavior.
Purpose of the Study:
- To investigate liquid-vapor interfacial dynamics during evaporation and condensation in submillimetric pores.
- To validate an analytical model for interfacial dynamics in confined wedge-shaped pores.
- To link pore-scale observations to macroscopic vapor gradients.
Main Methods:
- Utilized rapid x-ray synchrotron tomography for high-resolution imaging of pore-scale processes.
- Conducted experiments on sintered glass bead samples under controlled temperature and humidity.
- Developed and applied an analytical model for interfacial dynamics.
Main Results:
- Observed interfacial shapes agreed with the analytical model for confined wedge-shaped pores.
- The model accurately described early condensation stages and capillary forces on rough surfaces.
- Provided direct links between pore-scale interface evolution and macroscopic vapor gradients.
Conclusions:
- The study confirms a pore-scale analytical model for capillary condensation using synchrotron-based observations.
- Capillary condensation dynamics are critical for capillary-induced friction in physical systems and industrial applications.
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