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X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...

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Related Experiment Video

Updated: May 24, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Imaging the ultrasmall-angle x-ray scattering distribution with grating interferometry.

P Modregger1, F Scattarella, B R Pinzer

  • 1Swiss Light Source, Paul Scherrer Institut, 5232 Villigen, Switzerland. peter.modregger@psi.ch

Physical Review Letters
|March 10, 2012
PubMed
Summary
This summary is machine-generated.

Grating-based X-ray imaging now offers ultrasmall-angle X-ray scattering (USAXS) data. This breakthrough allows simultaneous analysis of both direct and reciprocal space information from samples.

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In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

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Related Experiment Videos

Last Updated: May 24, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
06:49

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

Published on: March 2, 2021

Area of Science:

  • Physics
  • Materials Science
  • Imaging Technology

Background:

  • Grating interferometry is a powerful X-ray imaging technique.
  • Traditionally, it provides direct space information like absorption, phase, and dark-field contrast.
  • These contrasts represent parameters of unresolved scattering distributions.

Purpose of the Study:

  • To develop a novel method for X-ray imaging using grating interferometry.
  • To extract ultrasmall-angle X-ray scattering (USAXS) distribution data.
  • To enable simultaneous access to both direct and reciprocal space information.

Main Methods:

  • Utilizing grating-based X-ray interferometry.
  • Implementing a new analytical approach to process the obtained contrast data.
  • Reconstructing the ultrasmall-angle X-ray scattering distribution.

Main Results:

  • Successfully demonstrated a method to obtain the ultrasmall-angle X-ray scattering distribution.
  • Achieved simultaneous acquisition of direct space contrast (absorption, phase, dark-field) and reciprocal space (USAXS) information.
  • Expanded the analytical capabilities of grating-based X-ray imaging.

Conclusions:

  • X-ray imaging with grating interferometry can provide both direct and reciprocal space information.
  • The presented method unlocks new possibilities for material characterization and analysis.
  • This technique enhances the understanding of material structures at micro- and nano-scales.