Core-level spectroscopy of point defects in single layer h-BN

Kazu Suenaga1, Haruka Kobayashi, Masanori Koshino

  • 1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan. suenaga-kazu@aist.go.jp

Summary

Electron energy-loss spectroscopy (EELS) precisely analyzes single-layered hexagonal boron nitride, identifying atomic defects. This technique reveals unique electronic states associated with boron monovacancies, crucial for understanding material properties.

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