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Measurement of Extracellular Ion Fluxes Using the Ion-selective Self-referencing Microelectrode Technique
Published on: May 3, 2015
Antonio Ramon Jimenez Ruiz1, Jorge Guevara Rosas, Fernando Seco Granja
1Instituto de Automática Industrial, Consejo Superior de Investigaciones Científicas, Ctra. Campo Real km 0.2, 28500 Arganda del Rey (Madrid), Spain; E-Mails: jguevara@iai.csic.es (J.G.R.); fseco@iai.csic.es (F.S.G.); cprieto@iai.csic.es (J.C.P.H.).
This study introduces an optical measurement system to track machine tool vibrations and deformations. The system achieves micrometric resolution, enabling real-time compensation for improved part quality.
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