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Updated: May 24, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
Broadband and mid-infrared absorber based on dielectric-thin metal film multilayers
Timothy D Corrigan1, Dong Hun Park, H Dennis Drew
1Department of Physics, University of Maryland, College Park, Maryland 20742, USA. tdcorrigan@concord.edu
Abstract:
We propose a periodic multilayer structure of dielectric and metal interlayers to achieve a near-perfect broadband absorber of mid-infrared radiation. We examine the influence of four factors on its performance: (1) the interlayer metal conductance, (2) the number of dielectric layers, (3) a nanopatterned antireflective layer, and (4) a reflective metallic bottom layer for backreflection. Absorption characteristics greater than 99% of the 300 K and 500 K blackbody spectra are found for the optimized structures. Incident angle and polarization dependence of the absorption spectra are examined. We also investigate the possibility of fabricating a nanopatterned antireflective layer to maximize absorption.

