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Chemical Synthesis of Porous Barium Titanate Thin Film and Thermal Stabilization of Ferroelectric Phase by Porosity-Induced Strain
Published on: March 27, 2018
Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films
1Department of Physics, Imperial College London, London SW7 2AZ, UK.
Optics Express
|March 16, 2012
Abstract:
Heteroepitaxial strain in ferroelectric thin films is known to have a significant impact on both their low and high frequency dielectric properties. In this paper, we use ex-situ spectroscopic ellipsometry to study the strain evolution with film thickness, and strain relaxation in ferroelectric Ba0.5Sr0.5
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