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Updated: May 24, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Characterization of semiconductor-laser phase noise and estimation of bit-error rate performance with low-speed
1Department of Electrical Engineering and Information Systems, The University of Tokyo7-3-1 Hongo, Bunkyo-Ku, Tokyo 113-8656, Japan. kikuchi@ginjo.t.u-tokyo.ac.jp
Abstract:
We develop a systematic method for characterizing semiconductor-laser phase noise, using a low-speed offline digital coherent receiver. The field spectrum, the FM-noise spectrum, and the phase-error variance measured with such a receiver can completely describe phase-noise characteristics of lasers under test. The sampling rate of the digital coherent receiver should be much higher than the phase-fluctuation speed. However, 1 GS/s is large enough for most of the single-mode semiconductor lasers. In addition to such phase-noise characterization, interpolating the taken data at 1.25 GS/s to form a data stream at 10 GS/s, we can predict the bit-error rate (BER) performance of multi-level modulated optical signals at 10 Gsymbol/s. The BER degradation due to the phase noise is well explained by the result of the phase-noise measurements.

