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Self-mixing in multi-transverse mode semiconductor lasers: model and potential application to multi-parametric
L Columbo1, M Brambilla, M Dabbicco
1CNR-Istituto di Fotonica e Nanotecnologie UOS Bari, c/o Dipartimento di Fisica Interateneo, Via Amendola 173, 70126 Bari, Italy. lorenzo.columbo@fisica.uniba.it
Optics Express
|March 16, 2012
Summary
A new model for Vertical Cavity Surface Emitting Lasers (VCSELs) in self-mixing schemes enables simultaneous measurement of target displacement and rotation. This advances optical sensing for precise motion tracking.
Area of Science:
- Optics and Photonics
- Laser Physics
- Optical Sensing
Background:
- Vertical Cavity Surface Emitting Lasers (VCSELs) are crucial components in various optical systems.
- Self-mixing interferometry (SMI) offers a compact and cost-effective sensing approach.
- Understanding the influence of laser field profiles in SMI is essential for enhanced performance.
Purpose of the Study:
- To develop a general model for medium aspect ratio VCSELs applicable to self-mixing interferometry.
- To investigate how the spatial distribution of the emitted and reflected fields affects the interferometric signal.
- To propose a novel sensor scheme for simultaneous measurement of longitudinal and transverse target displacements.
Main Methods:
- A theoretical model describing VCSELs using Gauss-Laguerre modes was developed.
- The model was adapted for self-mixing configurations by incorporating external mirror feedback.
- Analysis focused on the relationship between field profiles and self-mixing interferometric signals.
Main Results:
- The self-mixing signal was shown to be dependent on the spatial distribution of both emitted and reflected laser fields.
- Regimes of transverse mode-locking were identified within the self-mixing scheme.
- A practical sensor operational scheme was proposed based on these findings.
Conclusions:
- The proposed VCSEL model accurately captures self-mixing behavior influenced by field profiles.
- The identified transverse mode-locking regimes enable simultaneous measurement of multi-component target displacements.
- This work presents a promising advancement for high-precision optical displacement and rotation sensing applications.
