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Updated: May 24, 2026

Demonstration of a Hyperlens-integrated Microscope and Super-resolution Imaging
Published on: September 8, 2017
Experimental characterization of the transfer function for a Silver-dielectric superlens
Ciaran P Moore1, Richard J Blaikie
1MacDiarmid Institute for Advanced Materials and Nanotechnology, Department of Electrical and Computer Engineering, University of Canterbury, Private Bag 4800, Christchurch, New Zealand. c.moore@elec.canterbury.ac.nz
Abstract:
We describe a technique for experimentally determining the spatial-frequency modulation transfer function for near-field super-resolution imaging systems and present such a modulation transfer function for a 20|40|20 nm poly(vinyl alcohol)~(PVA)|Silver|PVA superlens exposed to 365 nm wavelength (i-line) radiation through a 50-nm thick tungsten mask. An extensive spectral characterization is achieved from only two exposures, with transmission coefficients determined for spatial frequencies as high as 13 µm-1, corresponding to λ / 4.75. The resulting transfer function is in good agreement with analytical models that incorporate the effects of mask-superlens interactions.

