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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Related Experiment Video

Updated: May 24, 2026

Frequency Mixing Magnetic Detection Scanner for Imaging Magnetic Particles in Planar Samples
07:01

Frequency Mixing Magnetic Detection Scanner for Imaging Magnetic Particles in Planar Samples

Published on: June 9, 2016

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution.

Maximilian Schneiderbauer1, Daniel Wastl, Franz J Giessibl

  • 1Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany.

Beilstein Journal of Nanotechnology
|March 20, 2012
PubMed
Summary

Researchers developed a new sensing technique using a qPlus sensor to image atomic and magnetic domain structures simultaneously. This breakthrough allows for combined scanning tunneling microscopy, atomic force microscopy, and magnetic force microscopy with a single probe.

Keywords:
hard dischigh-stiffness cantilevermagnetic force microscopyqPlus

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Last Updated: May 24, 2026

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Area of Science:

  • Surface science
  • Nanotechnology
  • Materials science

Background:

  • Magnetic force microscopy (MFM) images ferromagnetic domain structures using magnetic probe tips.
  • Imaging both atomic and domain structures requires probes sensitive to vastly different force gradients.
  • Current techniques face challenges due to the orders-of-magnitude difference in force gradients for atomic vs. magnetic interactions.

Purpose of the Study:

  • To bridge the gap between atomic and magnetic interaction force gradients for simultaneous imaging.
  • To establish a single-probe sensing technique capable of multiple microscopy modes.
  • To enhance the capabilities of nanoscale imaging for ferromagnetic materials.

Main Methods:

  • Utilized a qPlus sensor with a high stiffness (1800 Nm⁻¹) optimized for atomic interactions.
  • Adapted the sensor to detect millihertz frequency shifts caused by weak magnetic dipole-dipole interactions.
  • Integrated scanning tunneling microscopy, atomic force microscopy, and MFM functionalities into a single probe system.

Main Results:

  • Successfully imaged both atomic and magnetic domain structures with a single probe.
  • Demonstrated that the high-stiffness qPlus sensor is sensitive to subtle magnetic dipole forces.
  • Achieved simultaneous operation of scanning tunneling microscopy, atomic force microscopy, and MFM.

Conclusions:

  • A novel sensing technique using a qPlus sensor enables simultaneous atomic and magnetic domain imaging.
  • This integrated approach overcomes previous limitations in probe sensitivity for diverse nanoscale interactions.
  • The developed technique offers a versatile platform for advanced characterization of magnetic materials.