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Updated: May 23, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Nanopatterning of Si(001) for bottom-up fabrication of nanostructures
Yanfang Hu1, Hedieh Hosseinzadeh Kalachahi, Amal K Das
1Institut für Halbleiter- und Festkörperphysik, Johannes Kepler Universität Linz, Altenbergerstrasse 69, A-4020 Linz, Austria.
Abstract:
The epitaxial growth of Si on Si(001) under conditions at which the (2 × n) superstructure is forming has been investigated by scanning tunneling microscopy and Monte Carlo simulations. Our experiments reveal a periodic change of the surface morphology with the surface coverage of Si. A regular (2 × n) stripe pattern is observed at coverages of 0.7-0.9 monolayers that periodically alternates with less dense surface structures at lower Si surface coverages. The MC simulations show that the growth of Si is affected by step-edge barriers, which favors the formation of a rather uniform two-dimensional framework-like configuration. Subsequent deposition of Ge onto the (2 × n) stripe pattern yields a dense array of small Ge nanostructures.

