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Updated: May 23, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Design and performance of a versatile curved-crystal spectrometer for high-resolution spectroscopy in the tender
M Kavčič1, M Budnar, A Mühleisen
1J. Stefan Institute, Jamova 39, SI-1001, Ljubljana, Slovenia. matjaz.kavcic@ijs.si
Abstract:
A complete in-vacuum curved-crystal x-ray emission spectrometer in Johansson geometry has been constructed for a 2-6 keV energy range with sub natural line-width energy resolution. The spectrometer is designed to measure x-ray emission induced by photon and charged particle impact on solid and gaseous targets. It works with a relatively large x-ray source placed inside the Rowland circle and employs position sensitive detection of diffracted x-rays. Its compact modular design enables fast and easy installation at a synchrotron or particle accelerator beamline. The paper presents main characteristics of the spectrometer and illustrates its capabilities by showing few selected experimental examples.
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