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Updated: May 23, 2026

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps
Published on: August 17, 2017
Lifetime measurements in an electrostatic ion beam trap using image charge monitoring
Igor Rahinov1, Yoni Toker, Oded Heber
1Department of Particle Physics and Astrophysics, Weizmann Institute of Science, 76100 Rehovot, Israel. igorra@openu.ac.il
Abstract:
A technique for mass-selective lifetime measurements of keV ions in a linear electrostatic ion beam trap is presented. The technique is based on bunching the ions using a weak RF potential and non-destructive ion detection by a pick-up electrode. This method has no mass-limitation, possesses the advantage of inherent mass-selectivity, and offers a possibility of measuring simultaneously the lifetimes of different ion species with no need for prior mass-selection.

