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Updated: May 23, 2026

Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
Published on: July 20, 2022
Nanoscale spin wave localization using ferromagnetic resonance force microscopy
Han-Jong Chia1, Feng Guo, L M Belova
1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA. hanjong.chia@nist.gov
Abstract:
We use the dipolar fields from a magnetic cantilever tip to generate localized spin wave precession modes in an in-plane magnetized, thin ferromagnetic film. Multiple resonances from a series of localized modes are detected by ferromagnetic resonance force microscopy and reproduced by micromagnetic models that also reveal highly anisotropic mode profiles. Modeled scans of line defects using the lowest-frequency mode provide resolution predictions of (94.5±1.5) nm in the field direction, and (390±2) nm perpendicular to the field.
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