Digital holographic microscopy characterization of superdirective beam by metamaterial

Digital holographic microscopy (DHM) has been successfully applied for the first time to characterize the radiative out-of-plane emission properties of a superdirective device. Complementarily to near-field microscopy, DHM allows us to reconstruct the beam in the far-field region. The angular dispersion of the light beam radiated from a grating composed of air and anti-air metamaterial has been determined, and the proposed technique has highlighted a collimation degree higher than 0.04°, as already evaluated in a previous work. Further considerations on the retrieved phase map of the beam in the acquisition plane are presented.