Surface wave sensors based on nanometric layers of strongly absorbing materials

Yichen Zhang1, Christophe Arnold, Peter Offermans

  • 1Center for Nanophotonics, FOM Institute AMOLF, c/o Philips Research Laboratories, High Tech Campus 4, 5656 AE Eindhoven, The Netherlands.

Optics Express
|April 27, 2012
PubMed

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