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Updated: May 22, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic
G Gramse1, G Gomila, L Fumagalli
1Institut de Bioenginyeria de Catalunya, C/ Balidiri i Reixac 15-21, 08028 Barcelona, Spain. ggramse@ibecbarcelona.eu
Abstract:
We present a systematic analysis of the effects that the microscopic parts of electrostatic force microscopy probes (the cone and cantilever) have on the electrostatic interaction between the tip apex and thick insulating substrates (thickness > 100 μm). We discuss how these effects can influence the measurement and quantification of the local dielectric constant of the substrates. We propose and experimentally validate a general methodology that takes into account the influence of the cone and the cantilever, thus enabling us to obtain very accurate values of the dielectric constants of thick insulators.
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