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Morphological evaluation of new total etching and self etching adhesive system interfaces with dentin
Mithra N Hegde1, Priyadarshini Hegde, C Ravi Chandra
1Department of Conservative Dentistry and Endodontics, A.B. Shetty Memorial Institute of Dental Sciences, Deralakatte, Mangalore, Karnataka, India.
Journal of Conservative Dentistry : JCD
|May 5, 2012
Summary
This study compared total-etch and self-etch dental adhesives using scanning electron microscopy (SEM). Total-etch adhesives formed a thicker hybrid layer, while self-etch adhesives showed good adaptation without voids.
Area of Science:
- Dental Materials Science
- Adhesive Dentistry
- Scanning Electron Microscopy
Background:
- The resin-dentin interface is crucial for the longevity of dental restorations.
- Evaluating the quality of the hybrid layer formed by different adhesive systems is essential for clinical success.
Purpose of the Study:
- To compare the resin-dentin interface and hybrid layer quality of total-etch and self-etch adhesive systems.
- To utilize scanning electron microscopy (SEM) for detailed ultrastructural analysis.
Main Methods:
- Class V cavities were prepared in human molars.
- Four adhesive systems (XP Bond, Adper Single Bond II, Adper Easy One, Xeno V) were applied.
- Restored teeth underwent thermocycling, sectioning, demineralization, deproteinization, and SEM examination.
Main Results:
- XP Bond (total-etch) exhibited a clear, thick hybrid layer with long resin tags and minimal voids.
- Xeno V (self-etch) showed no clearly recognizable hybrid layer but demonstrated void-free, continuous adaptation to dentin.
Conclusions:
- Self-etch adhesives provide good adaptation to the resin-dentin interface without voids or phase separation.
- A thin, continuous hybrid layer is characteristic of self-etch adhesive systems' interaction with dentin.
