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Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

Time Multiplexing Super Resolving Technique for Imaging from a Moving Platform

Published on: February 12, 2014

High resolution heterodyne interferometer based on time-to-digital converter.

Fei Wang¹, Zhangcai Long, Bin Zhang

¹Department of Physics, Huazhong University of Science and Technology, Wuhan 430074, China.

The Review of Scientific Instruments

|May 8, 2012

Summary

A novel heterodyne interferometer utilizes a time-to-digital converter (TDC) for precise phase demodulation. This method achieves high resolution and avoids nonlinear distortions common in other phase measurement techniques.

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Area of Science:

Optics and Photonics
Metrology
Electronic Engineering

Background:

Heterodyne interferometry is crucial for high-precision measurements.
Existing phase demodulation methods like pulse width modulation (PWM) and in-phase/quadrature (I/Q) can suffer from nonlinear distortions.
There is a need for improved phase demodulation techniques in interferometry.

Purpose of the Study:

To introduce a new heterodyne interferometer design.
To demonstrate a novel phase demodulation approach using a time-to-digital converter (TDC).
To highlight the advantages of this new method over existing techniques.

Main Methods:

The study presents a heterodyne interferometer.
Phase demodulation is achieved by measuring time intervals of zero crossings of the heterodyne signal using a TDC.
The TDC provides a time resolution of 0.1 ns.

Main Results:

The developed interferometer achieves high resolution in phase demodulation.
The method provides linear phase demodulation, effectively avoiding nonlinear measuring distortions.
Performance is superior to indirect methods like PWM and I/Q.

Conclusions:

The proposed heterodyne interferometer with TDC-based phase demodulation offers a high-resolution and accurate measurement solution.
This technique overcomes limitations of traditional indirect phase demodulation methods.
The findings are significant for applications requiring precise optical measurements.