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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: May 22, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

An improved visual tracking method in scanning electron microscope.

Changhai Ru1, Yong Zhang, Haibo Huang

  • 1College of Automation, Harbin Engineering University, Harbin 150001, China. rchhai@gmail.com

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 8, 2012
PubMed
Summary
This summary is machine-generated.

This study introduces a new visual servoing framework for scanning electron microscopes (SEMs) that enhances nanomanipulation precision. The system achieves subpixel tracking accuracy, improving nanoscale interaction and measurement capabilities.

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Area of Science:

  • Nanotechnology
  • Microscopy
  • Robotics

Background:

  • Nanomanipulation systems in scanning electron microscopes (SEMs) often lack precise feedback mechanisms.
  • Open-loop nanomanipulators limit accuracy in nanoscale displacement and interaction.

Purpose of the Study:

  • To present a robust tracking framework for visual servoing applications within SEMs.
  • To enhance precision in nanoscale manipulation and measurement.
  • To address limitations of open-loop systems in nanomanipulation.

Main Methods:

  • Developed a subpixel template matching tracking algorithm utilizing contour models for SEM image analysis.
  • Integrated a feed-forward controller into the control system to optimize response time.
  • Implemented a visual servoing framework for real-time nanomanipulation control.

Main Results:

  • Achieved subpixel tracking accuracy in experimental validation.
  • Demonstrated robust performance even in challenging tracking environments with clutter.
  • Significantly improved the precision of nanoscale manipulation and measurement.

Conclusions:

  • The developed tracking framework provides a robust solution for precise nanomanipulation in SEMs.
  • Subpixel accuracy and improved response time are key benefits for nanoscale research.
  • The system enhances the capabilities of SEM-based nanomanipulation and measurement.