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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 22, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids.

Miriam Jaafar¹, David Martínez-Martín, Mariano Cuenca

¹Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, E-28049 Madrid, Spain.

Beilstein Journal of Nanotechnology

|May 8, 2012

Summary

We introduce drive-amplitude-modulation atomic force microscopy, a new dynamic mode offering superior performance across all environments. This stable and intuitive technique overcomes feedback instabilities inherent in frequency modulation, enhancing atomic force microscopy applications.

Keywords:

atomic force microscopy control systems dissipation frequency modulation noncontact

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Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

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Published on: July 22, 2015

Area of Science:

Surface science
Nanotechnology
Analytical chemistry

Background:

Atomic force microscopy (AFM) is crucial for nanoscale imaging.
Existing dynamic modes like frequency modulation (FM-AFM) face challenges with feedback instability, particularly during transitions between noncontact and contact regimes.
A need exists for robust AFM modes adaptable to diverse environments.

Purpose of the Study:

Introduce drive-amplitude modulation (DAM) atomic force microscopy as a novel dynamic mode.
Demonstrate DAM's high performance and stability across various environments (vacuum, air, liquid).
Highlight DAM's advantages over existing modes, particularly FM-AFM.

Main Methods:

Development of a new AFM feedback scheme utilizing two nested loops.
The first loop maintains constant cantilever oscillation amplitude by regulating driving force.
The second loop employs driving force as the feedback variable for topography acquisition.
Optional integration of a phase-locked loop for separating conservative and nonconservative forces.

Main Results:

Drive-amplitude modulation (DAM) atomic force microscopy exhibits outstanding performance in vacuum, air, and liquid.
The mode demonstrates high stability and intuitive operation.
DAM effectively avoids the feedback instabilities associated with the noncontact-to-contact transition seen in FM-AFM.

Conclusions:

DAM-AFM is a versatile and user-friendly dynamic mode for atomic force microscopy.
Its stability and broad environmental applicability make it a valuable advancement.
DAM-AFM offers a robust alternative to FM-AFM, particularly in challenging imaging scenarios.