Related Experiment Video
Updated: May 22, 2026

10:12
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Quantitative Rietveld texture analysis of CaSiO(3) perovskite deformed in a diamond anvil cell
Lowell Miyagi1, Sébastien Merkel, Takehiko Yagi
1Department of Earth and Planetary Science, University of California, Berkeley, CA 94720, USA.
Abstract:
The Rietveld method is used to extract quantitative texture information from a single synchrotron diffraction image of a CaSiO(3) perovskite sample deformed in axial compression in a diamond anvil cell. The image used for analysis was taken in radial geometry at 49 GPa and room temperature. We obtain a preferred orientation of {100} lattice planes oriented perpendicular to the compression direction and this is compatible with [Formula: see text] slip.

