Modeling the effects of low-LET cosmic rays on electronic components

A Keating1, P Goncalves, M Pimenta

  • 1Laboratory of Instrumentation and Experimental Particle Physics, Av. Elias Garcia, 14, 1º, 1000-149 Lisbon, Portugal. Keating@lip.pt

Summary

This study examines cosmic radiation damage to cells and electronics using various ion energies. Findings reveal critical insights into single event effects for space exploration safety.

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