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High-Throughput Total Internal Reflection Fluorescence and Direct Stochastic Optical Reconstruction Microscopy Using a Photonic Chip
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Tomographic diffractive microscopy with a wavefront sensor

Y Ruan1, P Bon, E Mudry

  • 1Institut Fresnel, CNRS, Aix-Marseille Université, Ecole Centrale Marseille, Marseille, France.

Optics Letters
|May 26, 2012
PubMed

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