Effects of Cu underlayer on the growth and magnetic properties of FePt thin films on MgO (001) substrate
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Updated: May 22, 2026

Sputter Growth and Characterization of Metamagnetic B2-ordered FeRh Epilayers
Published on: October 5, 2013
Abstract:
During ordering process of face centered tegragonal (fct) L1(0) phase of the FePt alloy, there exist three growth variants of axes (001) from original disordered fcc structured phase. When FePt film was directly deposited on the MgO (001) substrate, the variant perpendicular to the film plane grew, resulting in a low out-of-plane coercivity of 1.3 kOe. By using Cu underlayer, two variants lying in the film plane got same chance to grow, which caused an in-plane perpendicular alignment of the tetragonal axes of FePt L1(0) phases. The crystallographic relationship between Cu and FePt layers is Cu (100)<100>//fct FePt (100)<100>. A high in-plane coercivity of 4.6 kOe was obtained due to the high density of micro-defects (mcro-twins, anti-phase boundaries, etc.) in the film plane. This work demonstrated a way of selecting the growth variants of ordering process to adjust the magnetic properties of the ordered FePt thin films.
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